In situ characterization of surfaces at high temperature by using simultaneously a pyroreflectometer and an X-ray diffractometer

An optical fiber pyroreflectometer was adapted to an X-ray diffraction (XRD) high temperature chamber, in order to analyse and control in situ the thermoradiative properties and the temperature of the sample simultaneously examined by XRD. The modifications accompanying the high temperature oxidation of two different materials: TiO2−x plates and CVD (Ti, Si, N) coatings were chosen as illustrating examples.