Title of article :
Deposition of Teflon-polymer thin films by synchrotron radiation
photodecomposition
Author/Authors :
T. Katoh، نويسنده , , Y. Zhang )، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
Thin films of Teflon-polymers such as PTFE polytetrafluoroethylene., FEP polytetrafluoroethylene-co-hexafluoro-pro-
pylene.and PFA polytetrafluoroethylene-co-perluoroalkoxy vinyl ether. were deposited on Si 100. substrates by syn-
chrotron radiation the critical wavelength of 1.5 nm.etching of their corresponding starting materials in vacuo. Analysis of
the deposited films has been carried out with X-ray photoelectron spectroscopy XPS., Fourier transfer infrared FTIR.
spectroscopy as well as X-ray diffraction XRD.and their surface morphologies were observed under scanning electron
microscopy SEM.. For the deposition of the Teflon-polymer films, the processing with the synchrotron radiation
photo-etching was compared with that using laser ablation and significant differences between them are discussed. q1999
Elsevier Science B.V. All rights reserved.
Keywords :
Teflon , Thin film , Photo-etching , Laser ablation , synchrotron , polymer
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science