Abstract :
The dielectric perovskite-type oxide SrTiO3 thin films have been epitaxially grown on 001.LaAlO3 single crystal
substrates on the basis of optimization of pulsed laser deposition PLD.process. Several analytical techniques, such as X-ray
diffraction u–2u scan and f scan, AFM, XPS were used to characterize the epitaxial property, growth mechanism and
surface chemical composition of these SrTiO3 thin films. q1999 Elsevier Science B.V. All rights reserved.