Title of article :
In situ and ex situ AFM investigation of the formation of octadecylsiloxane monolayers
Author/Authors :
R. Resch، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
8
From page :
168
To page :
175
Abstract :
The formation of self-assembled monolayers of octadecylsiloxane adsorbed from dilute solutions of octadecyltrichlorosi- lane in toluene onto freshly cleaved mica surfaces was investigated using atomic force microscopy AFM.in tapping mode as a well-suited tool to obtain local information on the adsorption process. Three different measurement methods have been used: ex situ measurements and in situ measurements under stopped flowrdeposition as well as continuous flowrdeposition conditions. Although valuable information on the growth process can be obtained under stable and reproducible conditions with all methods addressed, in situ measurements bear a number of significant advantages for the investigation of such dynamic processes. q1999 Elsevier Science B.V. All rights reserved.
Keywords :
In situ measurements , Octadecylsiloxane , Self-assembled monolayers SAM. , atomic force microscopy
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995165
Link To Document :
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