Title of article :
In situ and ex situ AFM investigation of the formation of
octadecylsiloxane monolayers
Author/Authors :
R. Resch، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
The formation of self-assembled monolayers of octadecylsiloxane adsorbed from dilute solutions of octadecyltrichlorosi-
lane in toluene onto freshly cleaved mica surfaces was investigated using atomic force microscopy AFM.in tapping mode
as a well-suited tool to obtain local information on the adsorption process. Three different measurement methods have been
used: ex situ measurements and in situ measurements under stopped flowrdeposition as well as continuous flowrdeposition
conditions. Although valuable information on the growth process can be obtained under stable and reproducible conditions
with all methods addressed, in situ measurements bear a number of significant advantages for the investigation of such
dynamic processes. q1999 Elsevier Science B.V. All rights reserved.
Keywords :
In situ measurements , Octadecylsiloxane , Self-assembled monolayers SAM. , atomic force microscopy
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science