Epitaxial Pb Zr,Ti/O thin films on LaAlO 100/by 3 3 dipping–pyrolysis process

Epitaxially grown Pb Zr,Ti.O3thin films were prepared on LaAlO3 100.substrates by the dipping–pyrolysis DP. process using metal naphthenates as starting materials. Homogeneous Pb–Zr–Ti solutions with toluene were spin-coated onto the substrates and pyrolyzed at 5008C. Highly oriented Pb Zr,Ti.O3 films confirmed by X-ray diffraction XRD.u–2u scans were obtained by annealing at 7508C in air. The XRD pole-figure analysis and reciprocal space mapping of the resulting 0.6 mm films showed that the film comprising the c-axis oriented tetragonal phase have an epitaxial relationship with the LaAlO3 substrates. q1999 Elsevier Science B.V. All rights reserved.