Title of article :
Non-contact atomic force microscopy imaging of TiO 100/ 2
surfaces
Author/Authors :
Syed H. Raza، نويسنده , , C.L. Pang، نويسنده , , S.A. Haycock، نويسنده , , G. Fraser and G. Thornton، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
Atomically resolved non-contact fm mode atomic force microscopy images have been obtained from TiO2 100.surfaces.
The 1=1 surface is observed, as well as the 1=3 phase previously imaged with STM. The morphology of the latter
reconstruction consists of 110. microfacets. An additional reconstruction with 1=3 symmetry is observed, which is
assigned to a phase intermediate between the 1=1 and 1=3-microfacet terminations. q1999 Elsevier Science B.V. All
rights reserved.
Keywords :
Surface structure , NC-AFM , TiO2 100.
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science