Title of article :
Calculation of the frequency shift in dynamic force microscopy
Author/Authors :
H. Ho¨lscher )، نويسنده , , U.D. Schwarz، نويسنده , , A. Kubetzka and R. Wiesendanger، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
A theoretical study of the quality and the range of validity of different numerical and analytical methods to calculate the
frequency shift in dynamic force microscopy is presented. By comparison with exact results obtained by the numerical
solution of the equation of motion, it is demonstrated that the commonly used interpretation of the frequency shift as a
measure for the force gradient of the tip–sample interaction force is only valid for very small oscillation amplitudes and
leads to misinterpretations in most practical cases. Perturbation theory, however, allows the derivation of useful analytic
approximations. q1999 Elsevier Science B.V. All rights reserved
Keywords :
Frequency shift , atomic force microscopy , Tip–sample interaction , Dynamic force microscopy , Frequency modulation force microscopy , Oscillating cantilever
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science