Title of article :
Scanning tunneling microscopy study of GaAs 001/surfaces
Author/Authors :
Qikun Xue، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
20
From page :
244
To page :
263
Abstract :
While GaAs 001.is the most commonly used substrate in fabrication of wireless and opto-electronic devices based on III–V compound semiconductors by molecular beam epitaxy MBE., metallorganic chemical vapor deposition MOCVD. and related techniques, its surface structure have been disputed since the beginning of development of the techniques. Invention of scanning tunneling microscopy STM.has revolutionized the approach of surfacerinterface investigation, contributing greatly in the atomistic understanding of the GaAs surface phases. This paper reviews the STM studies of principal reconstructions, from As-rich c 4=4., 2=4, 2=6 to Ga-rich 4=2 and 4=6, found on the GaAs 001.surface. These studies, together with advanced theoretical efforts, have helped us to establish a unified structural model for various reconstructions, with which we can now explain most of the observations and long-standing controversies in atomic structures and surface stoichiometries. q1999 Elsevier Science B.V. All rights reserved.
Keywords :
GaAS , Molecular beam epitaxy , Scanning tunneling microscopy , First-principlestotal energy calculations , Reflection high energy electron diffraction
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995241
Link To Document :
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