Title of article :
Bismuth-induced surface structure of Si 100/studied by scanning tunneling microscopy
Author/Authors :
Masamichi Naitoh، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
5
From page :
38
To page :
42
Abstract :
We report results of a scanning tunneling microscopy investigation of the bismuth-induced structures at Si 100.surfaces. Long linear chains of bismuth dimers are formed on the Si 100.surface after bismuth deposition at 4808C. This may be self-organized by an enhanced migration of atoms along the chains. Moreover, bismuth atoms adsorbed on the surface induce, by expelling silicon atoms from the substrate surface, a 2=n.restructuring with linear defects perpendicular to the dimer rows on the Si terrace. q1999 Elsevier Science B.V. All rights reserved.
Keywords :
Si 100.surface , Surface structure , Surface migration , STM , Bismuth
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995262
Link To Document :
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