Title of article :
A SIMS and XPS study about ions influence on electrodeposited PbO films
Author/Authors :
R. Amadelli، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
4
From page :
200
To page :
203
Abstract :
XPS and SIMS investigation is presented on doped PbO2 electrodeposited on Ti under conditions in which the beta form of the oxide largely prevails. Complementary results obtained by XPS and SIMS analyses indicate that the doping species markedly affect the oxygen species accumulation on the oxide surface. In particular, metal cations added to electrodeposition bath are found to influence the Fy incorporation in the surface region of PbO2 even if these foreign species are not detected in the coatings. q1999 Published by Elsevier Science B.V. All rights reserved.
Keywords :
Lead dioxide , Fluoride , SIMS , XPS , Surface analysis
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995292
Link To Document :
بازگشت