Title of article :
A SIMS and XPS study about ions influence on electrodeposited
PbO films
Author/Authors :
R. Amadelli، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
XPS and SIMS investigation is presented on doped PbO2 electrodeposited on Ti under conditions in which the beta form
of the oxide largely prevails. Complementary results obtained by XPS and SIMS analyses indicate that the doping species
markedly affect the oxygen species accumulation on the oxide surface. In particular, metal cations added to electrodeposition
bath are found to influence the Fy incorporation in the surface region of PbO2 even if these foreign species are not detected
in the coatings. q1999 Published by Elsevier Science B.V. All rights reserved.
Keywords :
Lead dioxide , Fluoride , SIMS , XPS , Surface analysis
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science