Title of article :
A study of Pd growth on an yttria-stabilized ZrO 100/surface
Author/Authors :
H. Neergaard Waltenburg، نويسنده , , P.J. M?ller )، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
Thin palladium Pd. films on Zr Y.O2 100. 9.5 mol% Y2O3. have been studied by AES, LEED, and by TPD of
adsorbed nitric oxide 15NO.. The growth mode at 300 K is predominantly 3D, while changes in the morphology of the Pd
particles occur upon annealing. In TPD from 15NOrPdrZr Y.O2 100., substantial dissociation of NO is observed resulting
in desorption of N2 in addition to NO. Comparing to recent results for 15NO on Pd 112.and Pd 111., dissociation is more
dominant on the particles than on the single crystal surfaces. A higher degree of dissociation is observed on freshly deposited
Pd films than on annealed films, indicating that the surface of the annealed Pd particles is smoother with larger flat facets.
q1999 Elsevier Science B.V. All rights reserved.
Keywords :
Yttria-stabilized , Pd growth , ZrO2 100.surface
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science