Title of article
Tight-binding description of disordered nanostructures: an application to porous silicon
Author/Authors
J. Tagu¨en?a-Mart´?nez، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
5
From page
564
To page
568
Abstract
We present the calculations of the coefficient of light photo.absorption in porous silicon por-Si.using the supercell
tight-binding sp3sU model, in which the pores are columns digged in crystalline silicon. The disorder in the pore sizes and
the undulation of the silicon wires are taken into account by considering nonvertical interband transitions. The results
obtained for 8- and 32-atom supercells show a strong dependence on the pore morphology, i.e., the absorption coefficient
changes with the shape and size of the silicon wires even at constant porosity. The absorption spectrum of this model for
por-Si is defined by the interplay between the decrease in the indirectness of the material connected to the absorption
processes assisted by the scattering on the pores., which effectively reduces the direct gap, and the increase of the gap due to
the quantum confinement. q1999 Elsevier Science B.V. All rights reserved.
Keywords
Porous silicon , Tight-binding , Absorption
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995363
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