Title of article :
Data processing for spectrum-images: extracting information from
the data mountain
Author/Authors :
M. Prutton، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
Several analytical methods of electron, X-ray and ion microscopy are now capable of generating images containing an
entire spectrum at each pixel. These spectrum-images require new software tools for visualisation, classification and
analysis. This paper outlines a new method of visualisation for spectrum-images and two image classification methods that
can be used to identify the phases present in the sample. q1999 Elsevier Science B.V. All rights reserved.
Keywords :
SCANNING ELECTRON MICROSCOPY , Metal–semiconductor interfaces , Auger electron spectroscopy , image processing
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science