• Title of article

    Data processing for spectrum-images: extracting information from the data mountain

  • Author/Authors

    M. Prutton، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    10
  • From page
    1
  • To page
    10
  • Abstract
    Several analytical methods of electron, X-ray and ion microscopy are now capable of generating images containing an entire spectrum at each pixel. These spectrum-images require new software tools for visualisation, classification and analysis. This paper outlines a new method of visualisation for spectrum-images and two image classification methods that can be used to identify the phases present in the sample. q1999 Elsevier Science B.V. All rights reserved.
  • Keywords
    SCANNING ELECTRON MICROSCOPY , Metal–semiconductor interfaces , Auger electron spectroscopy , image processing
  • Journal title
    Applied Surface Science
  • Serial Year
    1999
  • Journal title
    Applied Surface Science
  • Record number

    995421