Title of article :
Surface morphology of organic thin films
Author/Authors :
J. Fraxedas، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
4
From page :
623
To page :
626
Abstract :
Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane TTF-TCNQ.and of p-nitrophenyl nitronyl nitroxide p-NPNN.have been grown on alkali halide substrates by vapor deposition techniques. Their surfaces reveal clearly differentiated morphologies, as measured with tapping mode atomic force microscopy TMAFM., exhibiting different kinds of defects. However, the films order in similar layered molecular structures parallel to the substrate plane. q1999 Elsevier Science B.V. All rights reserved.
Keywords :
Surface structure , roughness and topography , Surface defects , morphology , atomic force microscopy
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995543
Link To Document :
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