Title of article :
Surface morphology of organic thin films
Author/Authors :
J. Fraxedas، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane TTF-TCNQ.and of p-nitrophenyl nitronyl
nitroxide p-NPNN.have been grown on alkali halide substrates by vapor deposition techniques. Their surfaces reveal
clearly differentiated morphologies, as measured with tapping mode atomic force microscopy TMAFM., exhibiting
different kinds of defects. However, the films order in similar layered molecular structures parallel to the substrate plane.
q1999 Elsevier Science B.V. All rights reserved.
Keywords :
Surface structure , roughness and topography , Surface defects , morphology , atomic force microscopy
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science