Title of article :
Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling
Author/Authors :
Yves F. Dufreˆne )، نويسنده , , Thibault G. Marchal، نويسنده , , Paul G. Rouxhet، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
6
From page :
638
To page :
643
Abstract :
Atomic force microscopy AFM.has been used to investigate the organization of the collagen layer present on polymer substrata after adsorption and drying, while the adsorbed amount was monitored using X-ray photoelectron spectroscopy XPS.and radiochemical measurements. Differences in the organization of the adsorbed collagen layer surface coverage, layer thickness. observed by AFM fitted well with those found by models obtained from XPS and radiolabeling data. q1999 Elsevier Science B.V. All rights reserved
Keywords :
atomic force microscopy , Adsorbed protein layers , X-ray photoelectron spectroscopy , Radiolabeling
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995546
Link To Document :
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