Title of article :
Probing the organization of adsorbed protein layers:
complementarity of atomic force microscopy, X-ray photoelectron
spectroscopy and radiolabeling
Author/Authors :
Yves F. Dufreˆne )، نويسنده , , Thibault G. Marchal، نويسنده , , Paul G. Rouxhet، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
Atomic force microscopy AFM.has been used to investigate the organization of the collagen layer present on polymer
substrata after adsorption and drying, while the adsorbed amount was monitored using X-ray photoelectron spectroscopy
XPS.and radiochemical measurements. Differences in the organization of the adsorbed collagen layer surface coverage,
layer thickness. observed by AFM fitted well with those found by models obtained from XPS and radiolabeling data. q1999
Elsevier Science B.V. All rights reserved
Keywords :
atomic force microscopy , Adsorbed protein layers , X-ray photoelectron spectroscopy , Radiolabeling
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science