Title of article :
Doping effects of groups III, IV, or V elements on the emitter of CRT oxide cathodes
Author/Authors :
Yoshiki Hayashida )، نويسنده , , Tetsuro Ozawa، نويسنده , , Hiroshi Sakurai، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
5
From page :
7
To page :
11
Abstract :
Doping effects on CRT oxide cathodes was studied with dopant elements of groups III, IV, or V. Doping effects correspond negatively to both resistance of the emitter layer and melting points of dopants. The doping effect mechanism is discussed in terms of electrical conductivity of the emitter layer with interaction between dopants and reducing agents. Based on the idea that diffusibility of dopants could improve conductivity, the highest doping effect has been achieved with ZrO2 coprecipitation doping. q1999 Elsevier Science B.V. All rights reserved.
Keywords :
Doping , zirconium , Emitter , cathode , Rare earth , CRT
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995563
Link To Document :
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