Title of article
Doping effects of groups III, IV, or V elements on the emitter of CRT oxide cathodes
Author/Authors
Yoshiki Hayashida )، نويسنده , , Tetsuro Ozawa، نويسنده , , Hiroshi Sakurai، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
5
From page
7
To page
11
Abstract
Doping effects on CRT oxide cathodes was studied with dopant elements of groups III, IV, or V. Doping effects
correspond negatively to both resistance of the emitter layer and melting points of dopants. The doping effect mechanism is
discussed in terms of electrical conductivity of the emitter layer with interaction between dopants and reducing agents. Based
on the idea that diffusibility of dopants could improve conductivity, the highest doping effect has been achieved with ZrO2
coprecipitation doping. q1999 Elsevier Science B.V. All rights reserved.
Keywords
Doping , zirconium , Emitter , cathode , Rare earth , CRT
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995563
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