Title of article :
The structure of TiO thin film studied by Raman spectroscopy x and XRD
Author/Authors :
Wei-Xing Xu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
10
From page :
253
To page :
262
Abstract :
The structure of TiO thin films have been studied by Raman spectroscopy. The spectra show that in the film plane, the x atoms are connected in a way similar to that of bulk anatase. Due to the dimensional limitation, the stretching modes normal to the film plane, A1gqB1g n3qn2., are suppressed. The dependence of this suppression on the calcination temperature and film thickness has also been investigated. q1999 Published by Elsevier Science B.V. All rights reserved
Keywords :
TiOx thin films , XRD , Raman spectroscopy
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995695
Link To Document :
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