Title of article
Secondary ion mass spectrometry and optical characterization of Ti:LiNbO optical waveguides
Author/Authors
F. Caccavale، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
7
From page
195
To page
201
Abstract
Secondary ion mass spectrometry SIMS.and m-lines spectroscopy have been applied to study Ti:LiNbO3 slab optical
waveguides with high titanium surface concentration. By combining the two techniques, a saturation in the dependence of
the refractive index change on the dopant concentration has been found. By the use of SIMS in image mode, the lateral
diffusion of titanium in Ti:LiNbO3 channel waveguides has been observed and analyzed. q1999 Elsevier Science B.V. All
rights reserved
Keywords
Lithium niobate , Titanium diffusion , SIMS , m-lines spectroscopy
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995778
Link To Document