Title of article :
Photoemission study of monolayer Co on Si 111/ surface
Author/Authors :
Bongsoo Kim )، نويسنده , , K.J. Kim، نويسنده , , T.-H. Kang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
5
From page :
44
To page :
48
Abstract :
The interaction of monolayer Co with the Si 111. surface is investigated by means of core-level and valence-band photoemission spectroscopy in the range of room temperature to 7008C. Upon increasing the annealing temperature, several formations of silicides are observed. This ultra-thin layer upon annealing at 300–4008C has electronic structure closely related to the metastable CsCl-type CoSi which was discovered by molecular beam epitaxy MBE.grown onto the CoSi2 template to a thickness of ;100 A° . Further annealing up to 5008C leads to the «-CoSi-type electronic structure. Finally, the formation of CaF2-type CoSi2is observed after annealing above 6008C. They lead also to an island formation above 7008C. q1999 Elsevier Science B.V. All rights reserved.
Keywords :
Co silicides , Metal–semiconductor interfaces , Photoemission , epitaxy
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995825
Link To Document :
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