Title of article
Photoemission study of monolayer Co on Si 111/ surface
Author/Authors
Bongsoo Kim )، نويسنده , , K.J. Kim، نويسنده , , T.-H. Kang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
5
From page
44
To page
48
Abstract
The interaction of monolayer Co with the Si 111. surface is investigated by means of core-level and valence-band
photoemission spectroscopy in the range of room temperature to 7008C. Upon increasing the annealing temperature, several
formations of silicides are observed. This ultra-thin layer upon annealing at 300–4008C has electronic structure closely
related to the metastable CsCl-type CoSi which was discovered by molecular beam epitaxy MBE.grown onto the CoSi2 template to a thickness of ;100 A° . Further annealing up to 5008C leads to the «-CoSi-type electronic structure. Finally, the
formation of CaF2-type CoSi2is observed after annealing above 6008C. They lead also to an island formation above 7008C.
q1999 Elsevier Science B.V. All rights reserved.
Keywords
Co silicides , Metal–semiconductor interfaces , Photoemission , epitaxy
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995825
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