Abstract :
Double-crystal X-ray rocking curve DCRC.measurements were performed on HgTerCdTe superlattices grown by
molecular beam epitaxy MBE.in order to investigate the dependence of the structural properties on the superlattice period
number and the CdTe layer thickness. The results of the DCRC measurements showed that the full width at half maximum
FWHM.value of the principal peak decreased with increasing superlattice period number. As the CdTe layer thickness
approached the HgTe layer thickness, the FWHM value corresponding to the principal peak decreased, and the optical
absorption decreased. As the CdTe layer thickness changed, the detectable range of the HgTerCdTe superlattice related to
the value of the cut-off wavelength varied. These results indicate that HgTerCdTe superlattices with various superlattice
periods and CdTe layer thicknesses hold promise for potential applications in infrared photodetectors operating in a
wavelength region between 4.3 and 12.5 mm. q1999 Elsevier Science B.V. All rights reserved
