Title of article :
Optically induced defects in vitreous silica
Author/Authors :
S. Juodkazis، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
We report the observation of photoluminescence PL. in optically damaged vitreous silica v-SiO2. and its gradual
decrease by annealing at temperature range from room temperature to 773 K. Optical damage was induced by tightly focused
picosecond or femtosecond irradiation inside v-SiO2. PL bands at 280, 470 and 650 nm were observed. The PL can be
excited by 250 nm irradiation, which corresponds to the absorption band of the oxygen vacancy, VO. The decrease of PL
with annealing is explained by structural modifications of the defects in the damaged area. q2000 Elsevier Science B.V. All
rights reserved
Keywords :
Laserfabrication , silica , Light induced defects , Photoluminescence , Thermal annealing of defects , Three-dimensional optical memory
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science