Title of article :
Atomic resolution imaging using the electric double layer technique: friction vs. height contrast mechanisms
Author/Authors :
I.Yu. Sokolov، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
302
To page :
307
Abstract :
Atomic resolution images of the mineral astrophyllite have been obtained using the electric double layer technique wSokolov, I.Yu., Henderson, G.S., Wicks, F.J., Applied Physics Letters 70 1997.17x and when immersed in water. Both friction and height images were recorded simultaneously. We find that when scanning in water, the primary contribution to the image contrast comes from the friction force, in agreement with previously published studies. However, when scanning in the presence of an electric double layer EDL., the image contrast is primarily the result of vertical force. These results remain valid over a large range of load forces. q2000 Elsevier Science B.V. All rights reserved
Keywords :
atomic force microscopy , Molecular force interaction , True atomic resolution
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996070
Link To Document :
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