Title of article :
Using higher flexural modes in non-contact force microscopy
Author/Authors :
O. Pfeiffer )، نويسنده , , C. Loppacher، نويسنده , , C. Wattinger، نويسنده , , M. Bammerlin، نويسنده , , U. Gysin، نويسنده , , M. Guggisberg، نويسنده , , S. Rast، نويسنده , , R. Bennewitz، نويسنده , , E. Meyer، نويسنده , , H.-J. Gu¨ntherodt، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
337
To page :
342
Abstract :
The oscillation characteristics of higher flexural modes of a rectangular microfabricated silicon cantilever have been studied in ultra-high vacuum UHV.for a free cantilever and for a typical situation in non-contact force microscopy. The results are discussed with respect to the use of such modes in dynamic force microscopy DFM.and local dissipation measurements. q2000 Elsevier Science B.V. All rights reserved
Keywords :
Flexural modes , oscillation , Non-contact force microscopy
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996076
Link To Document :
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