Title of article :
A low-temperature scanning force microscope for investigating buried two-dimensional electron systems under quantum Hall conditions
Author/Authors :
P. Weitz، نويسنده , , E. Ahlswede )، نويسنده , , J. Weis، نويسنده , , K.v. Klitzing، نويسنده , , K. Eberl، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
349
To page :
354
Abstract :
A low-temperature scanning force microscope sensitive to electrostatics has been constructed for investigating a two-dimensional electron system 2DES.under quantum Hall conditions. In order to cope with the highly resistive properties of the 2DES under these conditions, a low-frequency measurement technique is presented, based on the shift of the cantilever’s resonance frequency induced by a small ac current modulation within the 2DES. Since the 2DES is buried in a GaAsrAlGaAs heterostructure, a special calibration technique has to be applied, which allows to map Hall-potential profiles with clearly submicron resolution. q2000 Elsevier Science B.V. All rights reserved
Keywords :
Scanning probe microscopy , Kelvin probe force microscopy , Quantum Hall Effect
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996078
Link To Document :
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