Title of article :
Core-level photoemission study of the Bi`GaAs 111/A interface
Author/Authors :
C. McGinley، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
Core-level photoemission spectra of the As 3d, Ga 3d and Bi 5d core levels were recorded for the Bi`GaAs
111.A- 2=2.surface. From the early stages of Bi growth, there are two distinct chemical environments for Bi. Surface Bi
is bonded to both As and Ga atoms. The deposition of approximately 1 ML of Bi removes the dangling bonds from the
surface As and Ga atoms, which are associated with the 2=2.vacancy-buckling structure. Annealing to 3508C reverses
this process and surface dangling bonds for Ga reappear. When the Bi had fully desorbed at 4258C, photoemission and
LEED results showed that the surface recovers the 2=2.vacancy structure but with a larger degree of surface disorder than
that found before the deposition of Bi. q2000 Elsevier Science B.V. All rights reserved
Keywords :
Low-energy electron diffraction , Synchrotron radiation photoelectron spectroscopy , Surface relaxation and reconstruction , Gallium arsenide 111.A , Bismuth , Metal–semiconductor interfaces
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science