Title of article :
Core-level photoemission study of the Bi`GaAs 111/A interface
Author/Authors :
C. McGinley، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
9
From page :
292
To page :
300
Abstract :
Core-level photoemission spectra of the As 3d, Ga 3d and Bi 5d core levels were recorded for the Bi`GaAs 111.A- 2=2.surface. From the early stages of Bi growth, there are two distinct chemical environments for Bi. Surface Bi is bonded to both As and Ga atoms. The deposition of approximately 1 ML of Bi removes the dangling bonds from the surface As and Ga atoms, which are associated with the 2=2.vacancy-buckling structure. Annealing to 3508C reverses this process and surface dangling bonds for Ga reappear. When the Bi had fully desorbed at 4258C, photoemission and LEED results showed that the surface recovers the 2=2.vacancy structure but with a larger degree of surface disorder than that found before the deposition of Bi. q2000 Elsevier Science B.V. All rights reserved
Keywords :
Low-energy electron diffraction , Synchrotron radiation photoelectron spectroscopy , Surface relaxation and reconstruction , Gallium arsenide 111.A , Bismuth , Metal–semiconductor interfaces
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996127
Link To Document :
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