Title of article :
Epitaxial growth of Bi Sr CuO films onto Si 001/ by molecular 2 2 x beam epitaxy
Author/Authors :
T. Tambo، نويسنده , , T. Arakawa، نويسنده , , A. Shimizu، نويسنده , , S. Hori، نويسنده , , C. Tatsuyama، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
161
To page :
166
Abstract :
We have studied the epitaxial growth of Bi2Sr2CuOx superconductor films onto a Si 001.substrate using a double buffer layer consisting of SrTiO3 and SrO by molecular beam epitaxy MBE.. The Bi2Sr2CuOx films are grown by a co-evaporation method with an oxygen radical source. The Bi2Sr2CuOx films do not grow directly on a Si 001.substrate under the same condition as the epitaxial growth on a commercial SrTiO3 001.substrate. Also, the Bi2Sr2CuOx films do not grow on an MBE-grown SrO 001. filmrSi 001. substrate, but grow on an MBE-grown SrTiO3 001. filmrSrO 001.rSi 001.. The epitaxial growth of the Bi2Sr2CuOx films on SrTiO3 001.rSrO 001.rSi 001.system is compared with that of the Bi2Sr2CuOx films on a commercial SrTiO3 001.substrate. The X-ray diffraction XRD.pattern shows the growth of Bi2Sr2CuOx 001. on SrTiO3rSrOrSi. The reflection high-energy electron diffraction RHEED. of the Bi2Sr2CuOx film grown on a SrTiO3 001.film shows a streak pattern with vague rings. The streak pattern is partially similar to an RHEED pattern of Bi2Sr2CuOx grown on a commercial SrTiO3 001.substrate. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
Bi-based cuprates , X-ray diffraction , Reflection high-energy electron diffraction , Si 001.substrate , atomic force microscopy , Molecular beam epitaxy
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996165
Link To Document :
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