Title of article :
Chemical trend of reflectance difference spectra of anion-rich compound semiconductor surfaces
Author/Authors :
Takashi Nakayama، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
5
From page :
260
To page :
264
Abstract :
Reflectance difference spectra of anion-covered GaAs 001.and 110.surfaces are calculated. By varying atom kinds of top-layer anions from N to P, As, and Sb, the spectral peak shifts toward lower energy, sharpens, and becomes large, being in good agreement with experiments. It is shown that these changes are closely related to the localization nature of anion dangling bond states at the surface and reflect the atomic orbital energies of anion atoms. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
Reflectance difference spectra , Anion-rich surface , Dimer , localization , Dangling bond
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996179
Link To Document :
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