Title of article :
Growth temperature effect on the heteroepitaxy of InSb on Si 111/
Author/Authors :
B.V. Rao)، نويسنده , , T. Okamoto، نويسنده , , A. Shinmura، نويسنده , , D. Gruznev، نويسنده , , M. Mori، نويسنده , , T. Tambo، نويسنده , , C. Tatsuyama1، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
335
To page :
340
Abstract :
Direct growth of InSb on Si 111.substrate is achieved by suitably adjusting the growth rate and substrate temperature. In this report, we detail the role of stoichiometry and growth temperature in the evolution of reflection high-energy electron diffraction RHEED.patterns, surface morphology and the crystal quality. InSb is grown on Si 111.- 7=7.surface by evaporating In and Sb simultaneously. Results indicate that smooth heteroepitaxial InSb films could be grown up to 3008C, and above this temperature, severe degradation in the epitaxial quality of the films is observed. Properties of the Sb-rich films are compared with those of In-rich films and the importance of stoichiometry in the crystal quality is discussed. q2000 Elsevier Science B.V. All rights reserved
Keywords :
Molecular beam epitaxy , RHEED , InSb , Si 111. , heteroepitaxy
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996191
Link To Document :
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