Title of article :
Surface passivation of GaAs by ultra-thin cubic GaN layer
Author/Authors :
Sanguan Anantathanasarn)، نويسنده , , Shin-ya Ootomo، نويسنده , , Tamotsu Hashizume a، نويسنده , , Hideki Hasegawa a، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
456
To page :
461
Abstract :
Attempts were made to passivate the GaAs 001.surface by a pseudomorphic ultra-thin cubic GaN layer formed by a nitrogen radical N-radical.or nitrogen plasma irradiation technique. Reflection high-energy electron diffraction RHEED. pattern observations and detailed X-ray photoelectron spectroscopy XPS.analysis have shown that ultra-thin cubic GaN layer on GaAs 001.surface with desirable surface stoichiometry can be realized with the optimization of surface nitridation process parameters. The passivation effects, characterized by ultra-high vacuum photoluminescence UHV PL.analysis, revealed strong enhancement in band-edge PL intensity of GaAs after passivation as large as a factor of 10 when compared with the as-grown clean molecular beam epitaxy MBE.GaAs surface. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
PL , XPS , GaN , GaAs , Nitrogen radicals , Surface passivation
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996210
Link To Document :
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