Title of article
First stages in the formation of ultra thin nickel layers on Cu 111/ and Ge 111/ and dissolution: an AES comparative study
Author/Authors
Ch. Girardeaux، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
5
From page
208
To page
212
Abstract
In this paper we present a low energy electron diffraction LEED.–Auger electron spectroscopy AES.comparative study
of slow deposition of nickel vapor onto clean Cu 111.and Ge 111.substrates at room temperature and dissolution of the
as-deposited ultrathin Ni layers at higher temperature. The main results of the present investigation are: i. the growth of
nickel on Cu 111.occurs via a layer-by-layer or a simultaneous multilayers growth mode and epitaxial pseudomorphic Ni
layers are obtained in agreement with previous studies, and ii. the growth of nickel on Ge 111. is described considering the
partial formation of a surface compound andror Ge surface segregation during deposition. Annealings of the as-deposited Ni
layers confirm these results: when the mass transport is high enough a complete dissolution of nickel in copper is observed
while superficial nickel germanide formation is obtained on germanium according to the phase diagrams of the systems.
q2000 Elsevier Science B.V. All rights reserved.
Keywords
AES , NirCu , NirGe , Growth mode
Journal title
Applied Surface Science
Serial Year
2000
Journal title
Applied Surface Science
Record number
996323
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