Title of article :
Studies on thermal property and atomic structure of the
Bi,Sb/rSi 111/surface
Author/Authors :
J. Yuhara، نويسنده , , T. Shirai and K. Matsuda، نويسنده , , Y. Hattori، نويسنده , , K. Morita، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The changes of atomic structure and the coverage of binary metals Bi,Sb.at the Si 111.surface induced by thermal
annealing have been studied by means of low energy electron diffraction LEED., Auger electron spectroscopy AES., and
Rutherford backscattering spectrometry RBS.techniques. It is shown that Bi and Sb form surface alloy of 63=63
structure. Moreover, coaxial impact-collision ion scattering spectroscopy CAICISS.has been used to determine the atomic
structures of the Bi,Sb.rSi 111.surface. The structural model for the Si 111.63=63- Bi,Sb.surface is proposed on the
basis of the polar- and azimuth-angle’s dependence of the Si, Bi, and Sb intensities. q2000 Elsevier Science B.V. All rights
reserved.
Keywords :
Binary metal , Si , Sb , Thermal property , Atomic structure , CAICISS , LEED , AES , RBS , Bi
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science