Title of article :
Surface morphology and strain relaxation of InAlAs buffer layers grown lattice mismatched on GaAs with inverse steps
Author/Authors :
Y. Cordier، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
4
From page :
442
To page :
445
Abstract :
In this work, MBE growth of lattice-relaxed InAlAs graded buffer layers on GaAs substrates has been studied. A simple method has been developed to optimize indium content decrease in inverse step buffer layers to generate totally relaxed metamorphic layers. The dependence of strain relaxation on the composition profile of the graded buffer is shown. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
Lattice mismatch , Metamorphic , strain relaxation , Atomic force microscopy , InAlAs on GaAs , Molecular Beam Epitaxy , High-resolution X-ray diffraction
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996550
Link To Document :
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