Title of article :
Optical and structural properties of two-sourced evaporated
ZnTe thin films
Author/Authors :
Akram K.S. Aqili، نويسنده , , Zulfiqar Ali، نويسنده , , Asghari Maqsood)، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
Optical properties of ZnTe films, deposited by thermal evaporation of Zn and Te sources, were studied in the range of
400–2000 nm by UV–VIS–NIR spectrophotometer. Variations of refractive index with incident photon energy are fitted to
a single oscillator model. Optical band gap and X-ray diffraction XRD.have been reported for ZnTe films formed at
substrate temperature of 3008C with different evaporation rates. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
refractive index , ZnTe thin film , Source temperature
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
