Title of article :
Angle-resolved photoemission study for double
Ag nano®lm structures
Author/Authors :
K. Takahashi، نويسنده , , A. Tanaka*، نويسنده , , H. Sasaki، نويسنده , , W. Gondo، نويسنده , , S. Suzuki، نويسنده , , S. Sato، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
We have carried out an angle-resolved photoemission study for Ag/Cu/Ag/Cu(1 1 1) system in order to investigate the
electronic coupling between the two quantum-well (QW) states in the double Ag nano®lm structures. It is found that the outer
nano®lm thickness dependence of QW state in double Ag nano®lm structures can be explained as the electronic coupling
through the thin Cu barrier layer between the QW states in the inner and outer Ag nano®lms. It is also found that the coupling
strength depends on the Cu barrier thickness. From these results, we discuss the electronic coupling between the two QW
states in the double Ag nano®lm structures. # 2001 Elsevier Science B.V. All rights reserved.
Keywords :
Angle-resolved photoemission spectroscopy , Metal±metal heterostructures , electronic coupling , Quantum-well state
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science