Title of article :
Angle-resolved photoemission study for double Ag nano®lm structures
Author/Authors :
K. Takahashi، نويسنده , , A. Tanaka*، نويسنده , , H. Sasaki، نويسنده , , W. Gondo، نويسنده , , S. Suzuki، نويسنده , , S. Sato، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
4
From page :
164
To page :
167
Abstract :
We have carried out an angle-resolved photoemission study for Ag/Cu/Ag/Cu(1 1 1) system in order to investigate the electronic coupling between the two quantum-well (QW) states in the double Ag nano®lm structures. It is found that the outer nano®lm thickness dependence of QW state in double Ag nano®lm structures can be explained as the electronic coupling through the thin Cu barrier layer between the QW states in the inner and outer Ag nano®lms. It is also found that the coupling strength depends on the Cu barrier thickness. From these results, we discuss the electronic coupling between the two QW states in the double Ag nano®lm structures. # 2001 Elsevier Science B.V. All rights reserved.
Keywords :
Angle-resolved photoemission spectroscopy , Metal±metal heterostructures , electronic coupling , Quantum-well state
Journal title :
Applied Surface Science
Serial Year :
2001
Journal title :
Applied Surface Science
Record number :
996703
Link To Document :
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