Title of article
The transport mechanism of YSZ thin ®lms prepared by MOCVD
Author/Authors
Sung-Yong Chun، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
7
From page
82
To page
88
Abstract
The effect of microstructure and substrate on the electrical conductivity of yttria stabilized zirconia ®lm (YSZ), prepared by
metal±organic chemical vapor deposition (MOCVD), was investigated by complex impedance analysis. The electrical
conductivity of the thin ®lms with columnar structure was controlled by the oxygen ion conduction across the columnar grain
boundary. The YSZ thin ®lm deposited on Al2O3 (1 0 2), MgO (1 0 0) and SiO2 with columnar grains exhibit the electrical
response of polycrystalline ceramic specimen. The dependence of activation energy and impedance diagram on substrate is
increased according to the mismatch of thermal expansion coef®cient between ®lm and substrate. # 2001 Elsevier Science
B.V. All rights reserved
Keywords
Electrical conductivity , Metal±organic chemical vapor deposition , Impedance spectroscopy
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
996845
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