Title of article
Stability of an ultra-thin Fe ®lm on a Cu(1 0 0) surface studied by positron-annihilation induced Auger electron spectroscopy (PAES)
Author/Authors
J.H. Kima، نويسنده , , *، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
5
From page
203
To page
207
Abstract
The stability and intermixing of ultra-thin Fe layers grown on a Cu(1 0 0) surface has been studied as a function of ®lm
thickness, growth temperature and annealing history using positron-annihilation induced Auger electron spectroscopy (PAES).
Theoretical calculations and previous experimental PAES studies indicate that when a complete metal layer is formed on top
of a metal substrate almost of all the PAES signal originates from the overlayer. However, in the research reported here, it was
found that even after depositions in excess of 1 equivalent monolayer (eq. ML) of Fe at 173 K and 3 eq. ML at 303 K, a
signi®cant fraction of the Cu PAES signal was observed. These result are consistent with the formation of Fe islands leaving
regions of exposed Cu surface or with Cu mixing with or moving on top of the deposited Fe. The increase in the fraction of Cu
in the top most layer observed as the sample was heated is consistent with a thermally induced increase in island height or an
increase in the diffusion of Cu into or on top of the surface layer. # 2001 Elsevier Science B.V. All rights reserved.
Keywords
Fe and Cu , Thin ®lm growth , Positron-annihilation induced Auger electron spectroscopy (PAES) , diffusion
Journal title
Applied Surface Science
Serial Year
2001
Journal title
Applied Surface Science
Record number
996943
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