Title of article :
CdSe monolayers, embedded in BeTe: analysis of interface vibrations by Raman spectroscopy
Author/Authors :
V Wagner، نويسنده , , J Wagner، نويسنده , , T Muck، نويسنده , , G Reuscher، نويسنده , , A Waag، نويسنده , , J Geurts، نويسنده , , Sadchikov، E. V. نويسنده , , S.V. Sorokin and G. Rega، نويسنده , , S.V Ivanov، نويسنده , , P.S Kop’ev، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
6
From page :
169
To page :
174
Abstract :
We present a Raman spectroscopy analysis of CdSe monolayers (MLs), embedded in BeTe. In detail, we compare the two types of interfacial bonds, which are possible for this material combination: BeSe-interfaces versus CdTe ones. For the case of BeSe-interfaces, a broad signature of Cd-related vibrations is observed, accompanied by indications of intermixing in the BeTe, revealing rather poor interface quality. In contrast, for CdTe-interfaces, distinct vibration modes from the CdSe-layers and the CdTe-interfaces occur. When describing them by a linear chain model, quantitative agreement is obtained if assuming a CdSe-layer thickness of 1 ML with locally 2 ML-contributions. Furthermore, the BeTe-phonon shows no signature of intermixing, thus underscoring the superior quality of the CdTe-interfaces.
Keywords :
Interface vibrations , BeTe , CdSe , Embedded monolayers , Raman
Journal title :
Applied Surface Science
Serial Year :
2001
Journal title :
Applied Surface Science
Record number :
997028
Link To Document :
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