Title of article :
Structure and optical properties of ScN thin films
Author/Authors :
Xuewen Bai، نويسنده , , M.E Kordesch، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
6
From page :
499
To page :
504
Abstract :
More than 100 ScN films ranging from 50 to 1000 nm thickness on quartz, silicon and sapphire substrates were grown by evaporation of Sc in the beam of an atomic nitrogen source and reactive sputtering from a Sc-metal target in a pure nitrogen atmosphere. ScN is the semiconductor. The refractive index in the infrared is n=2.46±0.15 for thin film ScN and the bandgap is 2.26 eV.
Keywords :
ScN , Refractive index , Bandgap
Journal title :
Applied Surface Science
Serial Year :
2001
Journal title :
Applied Surface Science
Record number :
997082
Link To Document :
بازگشت