Title of article :
Visualization of 3D-SIMS measurements
Author/Authors :
H. Hutter، نويسنده , , K. Nowikow، نويسنده , , K. Gammer، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
6
From page :
161
To page :
166
Abstract :
Secondary ion mass spectroscopy (SIMS) provides a method to examine the 3D distribution of chemical elements in solids. We created a software program (Visualizer) for the visualization of SIMS 3D data using the visualization toolkit (VTK), a free C++ class library for 3D graphics. Furthermore, we used fusion in order to obtain one single image from several 3D images, each showing the 3D distribution of one chemical element within the sample.
Keywords :
3D-SIMS , Channel plate correction , Visualization toolkit
Journal title :
Applied Surface Science
Serial Year :
2001
Journal title :
Applied Surface Science
Record number :
997224
Link To Document :
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