Title of article
Segregation of lead in oxide film of high-purity aluminum containing 100 ppm lead
Author/Authors
H Tsubakino، نويسنده , , A Nogami، نويسنده , , T Yamanoi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
5
From page
298
To page
302
Abstract
Surface segregation in high-purity Al–100 ppm Pb foil annealed for 4 h at 540 °C was studied mainly by transmission electron microscopy (TEM) observations. TEM–EDX demonstrated that almost of the lead element segregated not to aluminum surface but predominantly to the oxide amorphous film formed just above aluminum surface. The enrichment of lead in the oxide film was about 30 000 fold.
Keywords
Al–Pb , TEM , Oxide film , Segregation , EDX
Journal title
Applied Surface Science
Serial Year
2002
Journal title
Applied Surface Science
Record number
997539
Link To Document