Title of article
Laser crystallisation of poly-SiGe for microbolometers
Author/Authors
S. Chiussi، نويسنده , , Mônica C. Serra، نويسنده , , Pablo J. Serra، نويسنده , , P. Gonz?lez، نويسنده , , B. Le?n، نويسنده , , S. Urban، نويسنده , , G. Andr?، نويسنده , , J. Bergmann، نويسنده , , Adam F. Falk، نويسنده , , F. Fabbri، نويسنده , , L. Fornarini، نويسنده , , S. Martelli، نويسنده , , F. Rinaldi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
7
From page
166
To page
172
Abstract
Bolometers based on micromachined poly-SiGe as active elements have recently been demonstrated. The advantage of using poly-SiGe relies on its low thermal conductivity, high coefficient of temperature resistance and perfect compatibility with the IC silicon technology. In order to simplify a device integration of such elements, a combination of laser-assisted low thermal budget techniques such as laser-induced chemical vapour deposition and laser-assisted crystallisation has been proposed. The present paper shows the first results obtained using this “all laser-assisted” process for producing amorphous as well as polycrystalline SiGe alloys and the simulation of the crystallisation processes via numerical analysis for tuning the parameters of the crystallisation process.
Keywords
Numerical analysis , SiGe , Excimer laser , Nd:YAG laser , Laser-CVD , Laser crystallisation
Journal title
Applied Surface Science
Serial Year
2002
Journal title
Applied Surface Science
Record number
997571
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