Title of article :
Femtosecond laser ablation of transparent dielectrics: measurement and modelisation of crater profiles
Author/Authors :
S. Guizard، نويسنده , , A. Semerok )، نويسنده , , J. Gaudin، نويسنده , , M. Hashida، نويسنده , , P. Martin، نويسنده , , F. Quéré، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
5
From page :
364
To page :
368
Abstract :
Femtosecond lasers are promising tools for micro-machining requiring high surface quality and reliability. One of the many remarkable features in the case of transparent dielectrics is the shallowness of ablated craters, a still unexplained phenomena. We have measured the shape of ablated craters in corundum (α-Al2O3) for various pulse duration (from 60 fs to 14 ps). The evolution of ablated craters depth and shape with laser intensity depends on the pulse duration. Below 1 ps there is a clear threshold above which the depth increases dramatically from 0 to 100 nm, and then slowly increases with laser intensity. For longer pulses, the craters are much more shallow—about 20 nm, and we observe above a second threshold the appearance of a deeper hole in the centre of the first. The fundamental laser–matter interaction mechanisms at work during ablation are discussed. A model aiming to link these microscopic processes and the macroscopic measurements of ablation craters is presented and its results are compared to the experimental data.
Keywords :
Transparent dielectrics , Crater profiles , Femtosecond laser ablation
Journal title :
Applied Surface Science
Serial Year :
2002
Journal title :
Applied Surface Science
Record number :
997606
Link To Document :
بازگشت