Title of article :
Stress, strain and elastic energy at nanometric Ge dots on Si(0 0 1)
Author/Authors :
P. Raiteri، نويسنده , , F. Valentinotti، نويسنده , , L. Miglio، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
5
From page :
4
To page :
8
Abstract :
We perform molecular dynamics simulations to obtain the stress and strain distributions for Ge pyramids with {1 0 5} facets on Si(0 0 1). We show that the strain induced in the substrate is large and increasing with the pyramid size: up to 0.7% for the 22 nm in base, and corresponds to substrate bending below the pyramid.
Keywords :
stress , Strain , Dots , Silicon , Epitaxy , Germanium
Journal title :
Applied Surface Science
Serial Year :
2002
Journal title :
Applied Surface Science
Record number :
997691
Link To Document :
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