Title of article
Ion-implanted waveguides in Nd3+-doped silicate glass and Er3+/Yb3+ co-doped phosphate glass
Author/Authors
Feng Chen، نويسنده , , Xue-Lin Wang، نويسنده , , Xi-Shan Li، نويسنده , , Lili Hu، نويسنده , , Qing-Ming Lu، نويسنده , , Ke-Ming Wang، نويسنده , , Bo-Rong Shi، نويسنده , , Ding-Yu Shen، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
10
From page
92
To page
101
Abstract
The data are presented on the waveguides formation in the Nd3+-doped silicate glass and Er3+/Yb3+ co-doped phosphate glass by the implantations of He+ or Si+ ions, respectively. The prism-coupling method is used to measure the effective refractive indices of the waveguide dark modes. The refractive index profiles of the waveguides are reconstructed by using the reflectivity calculation method (RCM) and a comparison of such profiles among the different waveguides has been made. The reasons for the formation of the present waveguides are analyzed in a primary way.
Keywords
Ion implantation , Optical waveguide , Nd3+-doped silicate glass , Refractive index profile , Er3+/Yb3+ co-doped phosphate glass
Journal title
Applied Surface Science
Serial Year
2002
Journal title
Applied Surface Science
Record number
997994
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