• Title of article

    Molecular SIMS for organic layers: new insights

  • Author/Authors

    P. Bertrand، نويسنده , , A. Delcorte، نويسنده , , B.J. Garrison، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    6
  • From page
    160
  • To page
    165
  • Abstract
    Static SIMS is intensively used for molecular surface characterization. In the case of polymers and organic adsorbates, large characteristic fragments and intact parent ions are detected and used for analytical purpose. However, the exact nature of the mechanisms leading to large molecule emission and ionization is still debated. Recently, owing to comparisons between experiments (ion yields, kinetic energy distributions and disappearance cross-sections) and molecular dynamics (MD) simulations, progress has been made in the understanding of molecular fragment and parent molecule emission under ion beam bombardment. In this paper, we review some of the results obtained in this context. Remarkably, MD simulations allow us to confirm that the emission of large intact molecules can occur via collision cascade mechanisms. This involves a cooperative uplifting process, in which substrate recoil atoms with similar momentum push the molecule upward.
  • Keywords
    TOF-SIMS , MD simulation , Kinetic energy distribution , Ion emission , Disappearance cross-section , Ejection radius , Secondary ion mass spectrometry , Polymer
  • Journal title
    Applied Surface Science
  • Serial Year
    2003
  • Journal title
    Applied Surface Science
  • Record number

    998412