Title of article :
Effects of sample preparation on ion yield in the study of inorganic salts by s-SIMS
Author/Authors :
Frédéric Aubriet، نويسنده , , Claude Poleunis، نويسنده , , Patrick Bertrand، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
4
From page :
180
To page :
183
Abstract :
The influence of sample preparation on the ion yield in s-SIMS for alkaline salts was investigated. Potassium chromate and permanganate, dissolved in water, have been spin-coated on silicon or gold substrate before being analyzed by ToF-SIMS under 15 keV 69Ga+ primary ion bombardment. Analysis of powders pressed on In foil was also performed. The results were taken as reference to allow comparison. Spin coating on Si substrate did not lead to a significant modification as compared to the reference. In contrast, the cluster ion yield was increased by at least one order of magnitude when a gold substrate was used, especially in the negative detection mode. Moreover, large cluster ions were observed in the high mass range (up to m/z 1400) and anionized species were also detected.
Keywords :
Spin coating , TOF-SIMS , Potassium chromate , Potassium permanganate
Journal title :
Applied Surface Science
Serial Year :
2003
Journal title :
Applied Surface Science
Record number :
998416
Link To Document :
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