Title of article :
Miscut angles measurement and precise sample positioning with a four circle diffractometer
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
6
From page :
322
To page :
327
Abstract :
A method is derived for precise sample positioning with a four circle diffractometer. The sample can be oriented either with respect to a crystallographic plane or with respect to the sample surface with an accuracy of about 0.001°. The miscut angles can be easily deduced with an accuracy of a few 1/1000°.
Keywords :
Miscut , X-ray diffraction , Substrates
Journal title :
Applied Surface Science
Serial Year :
2001
Journal title :
Applied Surface Science
Record number :
998535
Link To Document :
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