Title of article :
Accelerated life tests of CRT oxide cathodes
Author/Authors :
G Gaertner، نويسنده , , D Raasch، نويسنده , , D Barratt، نويسنده , , S Jenkins، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
6
From page :
72
To page :
77
Abstract :
Sufficient oxide cathode life of several years in a cathode ray tube (CRT) environment at increased load is one of the key parameters in advanced CRT development. When changes are introduced, accelerated life tests are needed in order to quantify their impact. Hence the investigation of oxide cathode life limiting effects is the basis of accelerated life predictions. Especially, three basic effects are discussed and quantified: accelerated life by increased operating temperature, accelerated life by increased continuous load, and finally life acceleration by intermittent or continuos poisoning. These mechanisms can also suitably be combined.
Keywords :
Thermionic emission , Oxide cathodes , Accelerated life tests , Emission poisoning , Critical dc current density
Journal title :
Applied Surface Science
Serial Year :
2003
Journal title :
Applied Surface Science
Record number :
998563
Link To Document :
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