Prediction of field emitter cathode lifetime based on measurement of I–V curves

A technique is presented, which allows the prediction of field emitter cathode lifetime without long-term direct measurements of cathode parameters stability. This technique is based on periodic measurements of cathode I–V characteristics. Moreover, it allows performing a post-experiment optimization for the appropriate choice of the feedback system to provide a stable operation during a long time. The proposed technique was applied to study the emission properties of reticulated vitreous carbon (RVC) and thermo-enlarged graphite (TEG). For the given cathodes, the characteristic time of the cathode destruction was estimated.