Title of article :
A new horizon in secondary neutral mass spectrometry: post-ionization using a VUV free electron laser$
Author/Authors :
Igor V. Veryovkin، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
5
From page :
962
To page :
966
Abstract :
A new time-of-flight (TOF) mass spectrometer incorporating post-ionization of sputtered neutral species with tunable vacuum ultraviolet (VUV) light generated by a free electron laser (FEL) has been developed. Capabilities of this instrument, called SPIRIT, were demonstrated by experiments with photoionization of sputtered neutral gold atoms with 125 nm light generated by the VUV FEL located at Argonne National Laboratory (ANL). In a separate series of experiments with a fixed wavelength VUV light source, a 157 nm F2 laser, a useful yield (atoms detected per atoms sputtered) of about 12% and a mass resolution better than 1500 were demonstrated for molybdenum. # 2004 Elsevier B.V. All rights reserved.
Keywords :
Secondary neutral mass spectrometry , Photoionization of atoms and molecules , Free electron laser , Laser Desorption
Journal title :
Applied Surface Science
Serial Year :
2004
Journal title :
Applied Surface Science
Record number :
998632
Link To Document :
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